CobaltMaghrebV1, Maroc, Analysis, bibRecord, 000147

Effect of the CoZr/Cu interface quality on the magnetoresistance behavior in a spin-valve sandwich (CoZr/Cu/Co)

Identifieur interne : 000147 ( Maroc/Analysis ); précédent : 000146; suivant : 000148

Effect of the CoZr/Cu interface quality on the magnetoresistance behavior in a spin-valve sandwich (CoZr/Cu/Co)

Auteurs : M. El Harfaoui [Maroc] ; M. Faris [Maroc] ; A. Qachaou [Maroc] ; J. Ben Youssef [France] ; H. Le Gall [France] ; D. Meziane Mtalsi [Maroc]

Source :

Journal of magnetism and magnetic materials [ 0304-8853 ] ; 2001.

RBID : Pascal:01-0072384

Descripteurs français

Pascal (Inist)
- Magnétorésistance géante, Effet champ magnétique, Diffraction RX, Rugosité, Interface, Epaisseur, Diffusion petit angle, Aimantation, Couche interfaciale, Multicouche, Couche mince, Structure sandwich, Cuivre, Cobalt, Alliage base cobalt, Zirconium alliage, Etude expérimentale, Alliage Co97Zr3, Co Zr, Cu, Co, 7570P.
Wicri :
- topic : Cuivre, Cobalt.

English descriptors

KwdEn :
- Cobalt, Cobalt base alloys, Copper, Experimental study, Giant magnetoresistance, Interfaces, Interfacial layer, Magnetic field effects, Magnetization, Multilayers, Roughness, Sandwich structures, Small angle scattering, Thickness, Thin films, XRD, Zirconium alloys.

Abstract

The magnetoresistance (MR) and the saturation resistivity (ρ_s) are investigated at 300K in [Co₉₈Zr₂(t_CoZr(A))/ Cu(28 Å)/Co(25 Å)] thin films grown by RF diode sputtering. The highest value of transverse MR is obtained along the easy axis and the MR curve was saturated in a magnetic field of 100 Oe at room temperature. X-ray diffraction measurements (XRD) at low angles point out clearly the important interfacial roughness increase observed in magnetic structures with CoZr magnetic layers compared to (Co/Cu) basic multilayers. The MR behavior versus the CoZr magnetic layer thickness (t_CoZr) exhibits a maximum (3.6%) at t_CoZr = 30A, over which a significant decrease is observed. ρ_s decreases with increasing t_CoZr up to 30 A, and increases with increasing thickness toward the value of the measured CoZr thicker layer ( 40 μΩcm). The representation of the CoZrCu interface by a mixed zone in the Johnson-Camley semi-classical model reproduces well the experimental results of MR and ρ_s versus t_CoZr, confirming thus the important role of interface quality on the electronic transport properties.

Affiliations:

France, Maroc

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Pascal:01-0072384

Le document en format XML

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<series><title level="j" type="main">Journal of magnetism and magnetic materials</title>
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<seriesStmt><title level="j" type="main">Journal of magnetism and magnetic materials</title>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Cobalt</term>
<term>Cobalt base alloys</term>
<term>Copper</term>
<term>Experimental study</term>
<term>Giant magnetoresistance</term>
<term>Interfaces</term>
<term>Interfacial layer</term>
<term>Magnetic field effects</term>
<term>Magnetization</term>
<term>Multilayers</term>
<term>Roughness</term>
<term>Sandwich structures</term>
<term>Small angle scattering</term>
<term>Thickness</term>
<term>Thin films</term>
<term>XRD</term>
<term>Zirconium alloys</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Magnétorésistance géante</term>
<term>Effet champ magnétique</term>
<term>Diffraction RX</term>
<term>Rugosité</term>
<term>Interface</term>
<term>Epaisseur</term>
<term>Diffusion petit angle</term>
<term>Aimantation</term>
<term>Couche interfaciale</term>
<term>Multicouche</term>
<term>Couche mince</term>
<term>Structure sandwich</term>
<term>Cuivre</term>
<term>Cobalt</term>
<term>Alliage base cobalt</term>
<term>Zirconium alliage</term>
<term>Etude expérimentale</term>
<term>Alliage Co97Zr3</term>
<term>Co Zr</term>
<term>Cu</term>
<term>Co</term>
<term>7570P</term>
</keywords>
<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Cuivre</term>
<term>Cobalt</term>
</keywords>
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<front><div type="abstract" xml:lang="en">The magnetoresistance (MR) and the saturation resistivity (ρ<sub>s</sub>
) are investigated at 300K in [Co<sub>98</sub>
Zr<sub>2</sub>
(t<sub>CoZr</sub>
(A))/ Cu(28 Å)/Co(25 Å)] thin films grown by RF diode sputtering. The highest value of transverse MR is obtained along the easy axis and the MR curve was saturated in a magnetic field of 100 Oe at room temperature. X-ray diffraction measurements (XRD) at low angles point out clearly the important interfacial roughness increase observed in magnetic structures with CoZr magnetic layers compared to (Co/Cu) basic multilayers. The MR behavior versus the CoZr magnetic layer thickness (t<sub>CoZr</sub>
) exhibits a maximum (3.6%) at t<sub>CoZr</sub>
 = 30A, over which a significant decrease is observed. ρ<sub>s</sub>
 decreases with increasing t<sub>CoZr</sub>
 up to 30 A, and increases with increasing thickness toward the value of the measured CoZr thicker layer ( 40 μΩcm). The representation of the CoZrCu interface by a mixed zone in the Johnson-Camley semi-classical model reproduces well the experimental results of MR and ρ<sub>s</sub>
 versus t<sub>CoZr</sub>
, confirming thus the important role of interface quality on the electronic transport properties.</div>
</front>
</TEI>
<affiliations><list><country><li>France</li>
<li>Maroc</li>
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<tree><country name="Maroc"><noRegion><name sortKey="El Harfaoui, M" sort="El Harfaoui, M" uniqKey="El Harfaoui M" first="M." last="El Harfaoui">M. El Harfaoui</name>
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</record>

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Effect of the CoZr/Cu interface quality on the magnetoresistance behavior in a spin-valve sandwich (CoZr/Cu/Co)

Effect of the CoZr/Cu interface quality on the magnetoresistance behavior in a spin-valve sandwich (CoZr/Cu/Co)

Source :

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Links to Exploration step

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri